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PRECiV™ Measurement and Imaging Platform
Designed for Inspection and Measurements Tasks
Don’t compromise—PRECiV software works the way that you do in most popular industrial and materials science applications and offers dedicated functionality for the main tasks and applications, such as:
- Semiconductors: defect detection using infrared imaging, wafer navigation with a motorized stage, microscope control, or simple 3D measurements
- Electronics: EFI to clearly image thick parts, visual inspection for documentation and reporting, extended 2D measurements
Metals: test for macrostructural fractures in samples, determine parameters, and evaluate abnormalities and failure.
Powerful Analysis, Dynamic Imaging.
Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with PRECiV image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.
The BX53M simplifies complex microscopy tasks through its well-designed and easy-to-use controls. Users can get the most out of the microscope without the need for extensive training. The easy, comfortable operation of the BX53M also improves reproducibility by minimizing human error.