PRECiV™ Measurement and Imaging Platform

Designed for Inspection and Measurement Tasks

Don’t compromise—PRECiV software works the way that you do in most popular industrial and materials science applications and offers dedicated functionality for the main tasks and applications, such as:

• Semiconductors: defect detection using infrared imaging, wafer navigation with a motorized stage, microscope control, or simple 3D measurements
• Electronics: EFI to clearly image thick parts, visual inspection for documentation and reporting, extended 2D measurements

Metals: test for macrostructural fractures in samples, determine parameters, and evaluate abnormalities and failure.